Atomic Force Microscopy: Understanding Basic Modes and Advanced Applications

  • 9h 22m
  • Greg Haugstad
  • John Wiley & Sons (US)
  • 2012

This book enlightens readers on the basic surface properties and distance-dependent intersurface forces one must understand to obtain even simple data from an atomic force microscope (AFM). The material becomes progressively more complex throughout the book, explaining details of calibration, physical origin of artifacts, and signal/noise limitations. Coverage spans imaging, materials property characterization, in-liquid interfacial analysis, tribology, and electromagnetic interactions.

About the Author

GREG HAUGSTAD, PhD, is a technical staff member and Director of the Characterization Facility in the College of Science and Engineering at the University of Minnesota. He has collaborated with industry professionals on such technologies as medical X-ray imaging media, lubrication, inkjet printing, and more recently on biomedical device coatings. He teaches undergraduate and graduate AFM courses, as well as short professional courses, and has trained over 600 AFM users.

In this Book

  • Overview of AFM
  • Distance-Dependent Interactions
  • Z-Dependent Force Measurements with AFM
  • Topographic Imaging
  • Probing Material Properties I: Phase Imaging
  • Probing Material Properties II: Adhesive Nanomechanics and Mapping Distance-Dependent Interactions
  • Probing Material Properties III: Lateral Force Methods
  • Data Post-Processing and Statistical Analysis
  • Advanced Dynamic Force Methods