Atomic Force Microscopy: Understanding Basic Modes and Advanced Applications

  • 9h 22m
  • Greg Haugstad
  • John Wiley & Sons (US)
  • 2012
Explaining details of calibration, physical origin of artifacts, and signal/noise limitations, this book enlightens readers on the basic surface properties and distance-dependent intersurface forces one must understand to obtain even simple data from an atomic force microscope (AFM).