Atomic Force Microscopy: Understanding Basic Modes and Advanced Applications
- 9h 22m
- Greg Haugstad
- John Wiley & Sons (US)
This book enlightens readers on the basic surface properties and distance-dependent intersurface forces one must understand to obtain even simple data from an atomic force microscope (AFM). The material becomes progressively more complex throughout the book, explaining details of calibration, physical origin of artifacts, and signal/noise limitations. Coverage spans imaging, materials property characterization, in-liquid interfacial analysis, tribology, and electromagnetic interactions.
About the Author
GREG HAUGSTAD, PhD, is a technical staff member and Director of the Characterization Facility in the College of Science and Engineering at the University of Minnesota. He has collaborated with industry professionals on such technologies as medical X-ray imaging media, lubrication, inkjet printing, and more recently on biomedical device coatings. He teaches undergraduate and graduate AFM courses, as well as short professional courses, and has trained over 600 AFM users.
In this Book
Overview of AFM
Z-Dependent Force Measurements with AFM
Probing Material Properties I: Phase Imaging
Probing Material Properties II: Adhesive Nanomechanics and Mapping Distance-Dependent Interactions
Probing Material Properties III: Lateral Force Methods
Data Post-Processing and Statistical Analysis
Advanced Dynamic Force Methods