Machine Vision Inspection Systems: Image Processing, Concepts, Methodologies, and Applications
- 3h 33m
- Muthukumaran Malarvel, Nittaya Muangnak, Prasant Kumar Pattnaik, Soumya Ranjan Nayak, Surya Narayan Panda
- John Wiley & Sons (US)
This edited book brings together leading researchers, academic scientists and research scholars to put forward and share their experiences and research results on all aspects of an inspection system for detection analysis for various machine vision applications.